作者的详细信息
Ratnikov, V. V.
期 | 栏目 | 标题 | 文件 |
卷 52, 编号 2 (2018) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Change in the Character of Biaxial Stresses with an Increase in x from 0 to 0.7 in AlxGa1 – xN:Si Layers Obtained by Ammonia Molecular Beam Epitaxy | |
卷 52, 编号 6 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Effect of the Sapphire-Nitridation Level and Nucleation-Layer Enrichment with Aluminum on the Structural Properties of AlN Layers |