Информация об авторе
Ratnikov, V. V.
Выпуск | Раздел | Название | Файл |
Том 52, № 2 (2018) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Change in the Character of Biaxial Stresses with an Increase in x from 0 to 0.7 in AlxGa1 – xN:Si Layers Obtained by Ammonia Molecular Beam Epitaxy | |
Том 52, № 6 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Effect of the Sapphire-Nitridation Level and Nucleation-Layer Enrichment with Aluminum on the Structural Properties of AlN Layers |