作者的详细信息
Khramov, E. V.
| 期 | 栏目 | 标题 | 文件 |
| 卷 52, 编号 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Si | |
| 卷 53, 编号 16 (2019) | Nanostructures Technology | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Quartz |