Informaçao sobre o Autor
Khramov, E. V.
Edição | Seção | Título | Arquivo |
Volume 52, Nº 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Si | |
Volume 53, Nº 16 (2019) | Nanostructures Technology | XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Quartz |