Study of the photoinduced degradation of tandem photovoltaic converters based on a-Si:H/μc-Si:H
- 作者: Abramov A.1,2, Andronikov D.1,2, Emtsev K.1,2, Kukin A.1,2, Semenov A.1,2, Terukova E.1,2, Titov A.1,2, Yakovlev S.1,2
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隶属关系:
- Ioffe Physical–Technical Institute
- RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
- 期: 卷 50, 编号 8 (2016)
- 页面: 1074-1078
- 栏目: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/197670
- DOI: https://doi.org/10.1134/S1063782616080030
- ID: 197670
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详细
The photoinduced degradation of photovoltaic converters based on an a-Si:H/µc-Si:H tandem structure under a standard illuminance of 1000 W/m2 is studied. The spectral and current–voltage characteristics of specially fabricated samples with various degrees of crystallinity of the intrinsic layer in the lower (microcrystalline) cascade are measured in the course of the tests.
作者简介
A. Abramov
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
D. Andronikov
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
K. Emtsev
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
A. Kukin
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
A. Semenov
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
E. Terukova
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
A. Titov
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
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Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068
S. Yakovlev
Ioffe Physical–Technical Institute; RD Center forThin-Film Technologies in Energetics under the Ioffe Institute, Ioffe Physical–Technical Institute
Email: titovoz@gmail.com
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194068