Informaçao sobre o Autor
Voelskow, M.
| Edição | Seção | Título | Arquivo |
| Volume 51, Nº 9 (2017) | Fabrication, Treatment, and Testing of Materials and Structures | Specific features of the ion-beam synthesis of Ge nanocrystals in SiO2 thin films | |
| Volume 53, Nº 8 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Diffusion and Interaction of In and As Implanted into SiO2 Films |