Автор туралы ақпарат
Voelskow, M.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 51, № 9 (2017) | Fabrication, Treatment, and Testing of Materials and Structures | Specific features of the ion-beam synthesis of Ge nanocrystals in SiO2 thin films | |
| Том 53, № 8 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Diffusion and Interaction of In and As Implanted into SiO2 Films |