Informaçao sobre o Autor
Sherstnev, E.
| Edição | Seção | Título | Arquivo |
| Volume 53, Nº 4 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Defect Formation under Nitrogen-Ion Implantation and Subsequent Annealing in GaAs Structures with an Uncovered Surface and a Surface Covered with an AlN Film |