Study of Deep Levels in a HIT Solar Cell


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

The results of studying a HIT (heterojunction with an intrinsic thin layer) Ag/ITO/a-Si:H(p)/a-Si:H(i)/c-Si(n)/a-Si:H(i)/a-Si:H(n+)/ITO/Ag solar cell by the capacitance–voltage characteristic and current deep-level relaxation transient spectroscopy methods are presented. The temperature dependence of the capacitance–voltage characteristics of the HIT structure and deep-energy-level parameters are studied. The results of comprehensive studies by the above methods are used to determine the features of the energy-band diagram of actual HIT structures.

Sobre autores

D. Shilina

R&D Center of Thin Film Technologies in Energetics under the Ioffe Institute LLC

Email: vglit@yandex.ru
Rússia, St. Petersburg, 194064

V. Litvinov

Ryazan State Radio Engineering University

Autor responsável pela correspondência
Email: vglit@yandex.ru
Rússia, Ryazan, 390005

A. Maslov

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005

V. Mishustin

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005

E. Terukov

R&D Center of Thin Film Technologies in Energetics under the Ioffe Institute LLC; Ioffe Institute

Email: vglit@yandex.ru
Rússia, St. Petersburg, 194064; St. Petersburg, 194021

A. Titov

R&D Center of Thin Film Technologies in Energetics under the Ioffe Institute LLC; Ioffe Institute

Email: vglit@yandex.ru
Rússia, St. Petersburg, 194064; St. Petersburg, 194021

S. Vikhrov

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005

N. Vishnyakov

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005

V. Gudzev

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005

A. Ermachikhin

Ryazan State Radio Engineering University

Email: vglit@yandex.ru
Rússia, Ryazan, 390005


Declaração de direitos autorais © Pleiades Publishing, Ltd., 2018

Este site utiliza cookies

Ao continuar usando nosso site, você concorda com o procedimento de cookies que mantêm o site funcionando normalmente.

Informação sobre cookies