Автор туралы ақпарат
Timoshenko, V. Yu.
Шығарылым | Бөлім | Атауы | Файл |
Том 51, № 3 (2017) | Fabrication, Treatment, and Testing of Materials and Structures | Structural and optical properties of silicon-carbide nanowires produced by the high-temperature carbonization of silicon nanostructures | |
Том 51, № 8 (2017) | Surfaces, Interfaces, and Thin Films | Effect of free charge carriers on birefringence and dichroism in anisotropic porous silicon layers | |
Том 53, № 11 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Determination of the Free Charge Carrier Concentration in Boron-Doped Silicon Nanowires Using Attenuated Total Reflection Infrared Spectroscopy |