| Issue |
Section |
Title |
File |
| Vol 51, No 2 (2017) |
Surfaces, Interfaces, and Thin Films |
Study of silicon doped with zinc ions and annealed in oxygen |
|
| Vol 52, No 5 (2018) |
XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology |
Nanoparticle Formation in Zn+ and O+ Ion Sequentially Implanted SiO2 Film |
|
| Vol 52, No 8 (2018) |
Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) |
Formation of Precipitates in Si Implanted with 64Zn+ and 16O+ Ions |
|
| Vol 52, No 16 (2018) |
26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION |
XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Si |
|
| Vol 53, No 3 (2019) |
Surfaces, Interfaces, and Thin Films |
Structure and Properties of Zn-Implanted Si Near-Surface Layer Modification Depending on Irradiation Fluence of 132Xe26+ Ions with Energy of 167 MeV |
|
| Vol 53, No 16 (2019) |
Nanostructures Technology |
XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Quartz |
|
