Author Details
Levashov, S.
Issue | Section | Title | File |
Vol 51, No 9 (2017) | Surfaces, Interfaces, and Thin Films | Generation of surface electron states with a silicon–ultrathin-oxide interface under the field-induced damage of metal–oxide–semiconductor structures | |
Vol 53, No 1 (2019) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Determination of the Parameters of Metal–Insulator–Semiconductor Structures with Ultrathin Insulating Layer from High-Frequency Capacitance–Voltage Measurements | |
Vol 53, No 4 (2019) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Features of the Characteristics of Field-Resistant Silicon–Ultrathin Oxide–Polysilicon Structures |