Locally Strained Ge/SOI Structures with an Improved Heat Sink as an Active Medium for Silicon Optoelectronics


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Abstract

The results on the formation of locally strained Ge microstructures on silicon-on-insulator (SOI) substrates and investigation of their optical properties are presented. Suspended Ge structures are formed by optical lithography and plasmachemical and selective chemical etching using the “stress concentration” approach. To provide a heat sink from Ge microstructures, their formation scheme is modified so as to provide the mechanical contact of a part of the suspended microstructure with lower-lying layers. To implement this scheme, SOI substrates with a thin upper Si layer 100 nm in thickness are used. It is shown using the measurements of Raman spectra depending on the pumping power that local heating in such structures decreases. Measurements of the microphotoluminescence spectra show a considerable increase in the signal intensity from strained regions of Ge microstructures as well as the possibility of increasing the maximal optical pumping power (not leading to irreversible changes) for microstructures, in which the mechanical contact of the strained part with lower-lying layers is provided, when compared with suspended structures.

About the authors

D. V. Yurasov

Institute for Physics of Microstructures, Russian Academy of Sciences

Author for correspondence.
Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

N. A. Baidakova

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

V. A. Verbus

Institute for Physics of Microstructures, Russian Academy of Sciences; National Research University Higher School of Economics

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087; Nizhny Novgorod, 603155

N. S. Gusev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

A. I. Mashin

Lobachevsky State University of Nizhny Novgorod

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

E. E. Morozova

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

A. V. Nezhdanov

Lobachevsky State University of Nizhny Novgorod

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

A. V. Novikov

Institute for Physics of Microstructures, Russian Academy of Sciences; Lobachevsky State University of Nizhny Novgorod

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087; Nizhny Novgorod, 603950

E. V. Skorohodov

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

D. V. Shengurov

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

A. N. Yablonskiy

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: Inquisitor@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087


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