The Hall and Seebeck Effects in Bismuth Thin Films on Mica Substrates in the Temperature Range of 77–300 K

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

The effects of film thickness and block size on the Hall and Seebeck effects in bismuth films on mica substrates are analyzed using experimental data. A preferential decrease in the electron contribution with a decrease in the film thickness and a preferential decrease in the hole contribution with a decrease in the block size are established. The Hall and Seebeck coefficients are calculated using the classical size effect with regard to carrier scattering at block boundaries and anisotropy of the properties of carriers. In the calculation, the electron and hole mobility components and their concentration in a bismuth single crystal are used and the crystallographic orientation of the film crystal are taken into account. The results of the calculation are in good agreement with the experimental data. It is concluded that the value and sign of the Hall and Seebeck coefficients in bismuth films are determined by the competition of the classical size effect and scattering at block boundaries.

About the authors

V. A. Komarov

Herzen State Pedagogical University of Russia

Author for correspondence.
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186

V. M. Grabov

Herzen State Pedagogical University of Russia

Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186

A. V. Suslov

Herzen State Pedagogical University of Russia

Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186

N. S. Kablukova

Herzen State Pedagogical University of Russia

Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186

M. V. Suslov

Herzen State Pedagogical University of Russia

Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186


Copyright (c) 2019 Pleiades Publishing, Ltd.

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies