Formation of Nanoporous Copper-Silicide Films
- Authors: Buchin E.Y.1, Naumov V.V.1, Vasilyev S.V.1
-
Affiliations:
- Institute of Physics and Technology, Yaroslavl Branch, Russian Academy of Sciences
- Issue: Vol 53, No 3 (2019)
- Pages: 395-399
- Section: Fabrication, Treatment, and Testing of Materials and Structures
- URL: https://journals.rcsi.science/1063-7826/article/view/205890
- DOI: https://doi.org/10.1134/S1063782619030059
- ID: 205890
Cite item
Abstract
The possibility of forming nanoporous copper-silicide films with different phase compositions is experimentally demonstrated. For this purpose, the parameters of the initial a-Si/Cu structure and the conditions of its annealing are chosen so that the process of solid-phase synthesis comes to a halt at the stage of formation of a branched silicide cluster. Then the films are subjected to liquid etching in a mixture of diluted inorganic acids. In this case, the metastable CuxSi phase with a low Cu content is selectively removed, and a three-dimensional silicide cluster is released. At the same time, surface Kirkendall voids present in the films open. As a result of these two processes in combination, a nanoporous structure is formed.
About the authors
E. Yu. Buchin
Institute of Physics and Technology, Yaroslavl Branch, Russian Academy of Sciences
Author for correspondence.
Email: imi.buchin@rambler.ru
Russian Federation, Yaroslavl, 150007
V. V. Naumov
Institute of Physics and Technology, Yaroslavl Branch, Russian Academy of Sciences
Email: imi.buchin@rambler.ru
Russian Federation, Yaroslavl, 150007
S. V. Vasilyev
Institute of Physics and Technology, Yaroslavl Branch, Russian Academy of Sciences
Email: imi.buchin@rambler.ru
Russian Federation, Yaroslavl, 150007