Modulation of the Charge of Germanium MIS Structures with Fluorine-Containing Insulators
- Authors: Shalimova M.B.1
-
Affiliations:
- Samara National Research University
- Issue: Vol 52, No 8 (2018)
- Pages: 1068-1071
- Section: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/203915
- DOI: https://doi.org/10.1134/S1063782618080201
- ID: 203915
Cite item
Abstract
An insulator layer of ErF3, YF3, NdF3, and TmF3 was formed in n-type Ge-based MIS (metal–insulator–semiconductor) structures. It is shown that no negative effective charge is observed in these Ge MIS structures, while the degradation of electric characteristics and the rise of density of surface states leads to an increase in the positive charge. The positive charge formed at the Ge–rare-earth-element fluoride interface can compensate the negative charge of dangling bonds on the surface of Ge, which is potentially promising for modulation of the charge magnitude and sign in MIS devices based on Ge.
About the authors
M. B. Shalimova
Samara National Research University
Author for correspondence.
Email: shamb@ssau.ru
Russian Federation, Samara, 443011