About the authors
Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod
Author for correspondence.
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
Institute for Physics of Microstructures
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950
Institute for Physics of Microstructures
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950
Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Novosibirsk, 630090; Novosibirsk, 630090
Institute of Semiconductor Physics, Siberian Branch
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Novosibirsk, 630090
Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod
Email: rumyantsev@ipm.sci-nnov.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950