Selective etching of Si, SiGe, Ge and its usage for increasing the efficiency of silicon solar cells


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Abstract

Dependences of the etch rates for KOH and HF:H2O2:CH3COOH solutions on SiGe layer composition were investigated. The obtained results has been proposed to use for formation of the submicron relief on the silicon surface via selective etching of the structures with Ge(Si) self-assembled nanoislands. In the framework of the proposed approach the Ge(Si) nanoislands serve as a mask for selective etching of Si in a mixture of an aqueous solution of KOH with isopropyl alcohol, followed by the islands removal from the surface by the selective etching in HF:H2O2:CH3COOH. It was demonstrated experimentally that such approach allows to produce the submicron relief on a silicon surface, which leads to the significant decrease of the reflectivity in a wide spectral range. It is believed that the proposed method of surface relief formation can be used to improve the efficiency of the thin-film solar cells based on the crystalline silicon.

About the authors

N. A. Baidakova

Institute for Physics of Microstructures

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

V. A. Verbus

Institute for Physics of Microstructures; National Research University Higher School of Economics

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603155

E. E. Morozova

Institute for Physics of Microstructures

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

A. V. Novikov

Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod

Author for correspondence.
Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

E. V. Skorohodov

Institute for Physics of Microstructures

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

M. V. Shaleev

Institute for Physics of Microstructures

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

D. V. Yurasov

Institute for Physics of Microstructures

Email: anov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

A. Hombe

Nagoya University

Email: anov@ipmras.ru
Japan, Furocho, Chikusa-ku, Nagoya, 464-8603

Y. Kurokawa

Nagoya University

Email: anov@ipmras.ru
Japan, Furocho, Chikusa-ku, Nagoya, 464-8603

N. Usami

Nagoya University

Email: anov@ipmras.ru
Japan, Furocho, Chikusa-ku, Nagoya, 464-8603


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