Structural features of Sm1–xEuxS thin polycrystalline films

Resumo

Thin polycrystalline Sm_1–xEu_xS films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-гау coherent scattering regions was studied. It is shown that formation of Sm_1–xEu_xS films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.