Dependence of the conductivity on the active-region thickness in GaAs thin-film Schottky diodes
- Авторлар: Zuev S.A.1, Kilessa G.V.1, Asanov E.E.1, Starostenko V.V.1, Pokrova S.V.1
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Мекемелер:
- Vernadsky Crimean Federal University
- Шығарылым: Том 50, № 6 (2016)
- Беттер: 810-814
- Бөлім: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/197279
- DOI: https://doi.org/10.1134/S1063782616060269
- ID: 197279
Дәйексөз келтіру
Аннотация
The dependences of the electrical characteristics of thin-film structures with Schottky barrier on gallium arsenide are studied using Monte Carlo numerical simulation in the kinetic approximation with the main scattering mechanisms taken into account. The dependences of the diode conductivity on the voltage and channel thickness are obtained. It is shown that the relation between the diode voltage and conductivity changes at a small channel thickness, which is explained by barrier field expulsion to the substrate.
Авторлар туралы
S. Zuev
Vernadsky Crimean Federal University
Хат алмасуға жауапты Автор.
Email: sazuev@yandex.ru
Ресей, ul. Vernadskogo 4, Simferopol, 295007
G. Kilessa
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Ресей, ul. Vernadskogo 4, Simferopol, 295007
E. Asanov
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Ресей, ul. Vernadskogo 4, Simferopol, 295007
V. Starostenko
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Ресей, ul. Vernadskogo 4, Simferopol, 295007
S. Pokrova
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Ресей, ul. Vernadskogo 4, Simferopol, 295007
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