Dependence of the conductivity on the active-region thickness in GaAs thin-film Schottky diodes


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Abstract

The dependences of the electrical characteristics of thin-film structures with Schottky barrier on gallium arsenide are studied using Monte Carlo numerical simulation in the kinetic approximation with the main scattering mechanisms taken into account. The dependences of the diode conductivity on the voltage and channel thickness are obtained. It is shown that the relation between the diode voltage and conductivity changes at a small channel thickness, which is explained by barrier field expulsion to the substrate.

About the authors

S. A. Zuev

Vernadsky Crimean Federal University

Author for correspondence.
Email: sazuev@yandex.ru
Russian Federation, ul. Vernadskogo 4, Simferopol, 295007

G. V. Kilessa

Vernadsky Crimean Federal University

Email: sazuev@yandex.ru
Russian Federation, ul. Vernadskogo 4, Simferopol, 295007

E. E. Asanov

Vernadsky Crimean Federal University

Email: sazuev@yandex.ru
Russian Federation, ul. Vernadskogo 4, Simferopol, 295007

V. V. Starostenko

Vernadsky Crimean Federal University

Email: sazuev@yandex.ru
Russian Federation, ul. Vernadskogo 4, Simferopol, 295007

S. V. Pokrova

Vernadsky Crimean Federal University

Email: sazuev@yandex.ru
Russian Federation, ul. Vernadskogo 4, Simferopol, 295007


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