Isothermal current–voltage characteristics of high-voltage 4H-SiC junction barrier Schottky rectifiers
- 作者: Levinshtein M.E.1, Ivanov P.A.1, Zhang Q.J.2, Palmour J.W.2
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隶属关系:
- Ioffe Physical–Technical Institute
- Cree Inc., 4600 Silicon Dr.
- 期: 卷 50, 编号 5 (2016)
- 页面: 656-661
- 栏目: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/197119
- DOI: https://doi.org/10.1134/S1063782616050158
- ID: 197119
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详细
The forward-pulse isothermal current–voltage characteristics of 4H-SiC junction barrier Schottky rectifiers (JBSs) with a nominal blocking voltage of 1700 V are measured in the temperature range from–80 to +90°C (193–363 K) up to current densities j of ~5600 A/cm2 at–80°C and 3000 A/cm2 at +90°C. In these measurements, the overheating of the structures relative to the ambient temperature, ΔT, did not exceed several degrees. At higher current densities, the effective injection of minority carriers (holes) into the base of the structures is observed, which is accompanied by the appearance of an S-type differential resistance. The pulsed isothermal current–voltage characteristics are also measured at a temperature of 77 K.
作者简介
M. Levinshtein
Ioffe Physical–Technical Institute
编辑信件的主要联系方式.
Email: melev@nimis.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
P. Ivanov
Ioffe Physical–Technical Institute
Email: melev@nimis.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
Q. Zhang
Cree Inc., 4600 Silicon Dr.
Email: melev@nimis.ioffe.ru
美国, Durham, NC, 27703
J. Palmour
Cree Inc., 4600 Silicon Dr.
Email: melev@nimis.ioffe.ru
美国, Durham, NC, 27703
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