Russian Microelectronics
ISSN 1063-7397 (Print)
ISSN 1608-3415 (Online)
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Keywords
ADC
DAC
GaAs
MIS varicap
RUSSIAN Microelectronics
atomic force microscopy
compaction in a magnetic field
ferroelectrics
gallium arsenide
gallium nitride
heterostructure
heterostructures
interface
leakage current
magnetic texture
phase shifter
porous silicon
recrystallization
silicon carbide
varicap
zirconia
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Keywords
ADC
DAC
GaAs
MIS varicap
RUSSIAN Microelectronics
atomic force microscopy
compaction in a magnetic field
ferroelectrics
gallium arsenide
gallium nitride
heterostructure
heterostructures
interface
leakage current
magnetic texture
phase shifter
porous silicon
recrystallization
silicon carbide
varicap
zirconia
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For Librarians
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Author Details
Author Details
Lukichev, V. F.
Issue
Section
Title
File
Vol 45, No 3 (2016)
Article
Modeling of the high aspect groove etching in Si in a Cl
2
/Ar mixture plasma
Vol 45, No 5 (2016)
Article
Schmidt decomposition and analysis of statistical correlations
Vol 46, No 6 (2017)
Article
Statistical Models and Adequacy Validation for Optical Quantum State Tomography with Quadrature Measurements
Vol 47, No 5 (2018)
Article
Analytic Model of Transit-Time Diodes and Transistors for the Generation and Detection of THz Radiation
Vol 48, No 3 (2019)
Article
Monte Carlo Simulation of Defects of a Trench Profile in the Process of Deep Reactive Ion Etching of Silicon
Vol 48, No 4 (2019)
Article
Effect of the Composition on the Dielectric Properties and Charge Transfer in 2D GaS
1 –
х
Se
х
Materials
Vol 48, No 6 (2019)
Article
Charge Transport in Layer Gallium Monosulfide in Direct and Alternate Electric Fields
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