Admittance of MIS Structures Based on MBE Hg1 – xCdxTe (x = 0.21–0.23) in a Wide Temperature Range
- Авторы: Voitsekhovskii A.1, Kulchitsky N.2, Nesmelov S.1, Dzyadukh S.1
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Учреждения:
- National Research Tomsk State University
- Russian Technological University (MIREA)
- Выпуск: Том 63, № 9 (2018)
- Страницы: 1112-1118
- Раздел: Articles from the Russian Journal Prikladnaya Fizika
- URL: https://journals.rcsi.science/1064-2269/article/view/200205
- DOI: https://doi.org/10.1134/S1064226918090231
- ID: 200205
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Аннотация
Features of the electrical properties of n(p)-Hg1–xCdxTe (x = 0.21–0.23) with Al2O3 or SiO2/Si3N4 dielectrics are considered. The HgCdTe films were grown by means of molecular beam epitaxy on GaAs(013) and Si(013) substrates. The possibility of determining the basic parameters of MIS structures based on n(p)-Hg1–xCdxTe (x = 0.21–0.23) with and without a varizonal layer from admittance measurements in a wide range of temperatures and frequencies is discussed.
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Об авторах
A. Voitsekhovskii
National Research Tomsk State University
Автор, ответственный за переписку.
Email: vav43@mail.tsu.ru
Россия, Tomsk, 634050
N. Kulchitsky
Russian Technological University (MIREA)
Email: vav43@mail.tsu.ru
Россия, Moscow, 119454
S. Nesmelov
National Research Tomsk State University
Email: vav43@mail.tsu.ru
Россия, Tomsk, 634050
S. Dzyadukh
National Research Tomsk State University
Email: vav43@mail.tsu.ru
Россия, Tomsk, 634050