作者的详细信息
Ploog, K.
| 期 | 栏目 | 标题 | 文件 |
| 卷 52, 编号 5 (2018) | XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization | Molecular Beam Epitaxy of Materials Interfaces with Atomic Precision |