作者的详细信息
Makarevskaya, E. A.
| 期 | 栏目 | 标题 | 文件 |
| 卷 52, 编号 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam | |
| 卷 53, 编号 14 (2019) | Nanostructures Characterization | Arsenic Diffusion in the Natural Oxidation of the Heavily Defected GaAs Surface | |
| 卷 53, 编号 14 (2019) | Nanostructures Characterization | J–V Characteristic of p–n Structure Formed on n-GaAs Surface by Ar+ Ion Beam |