作者的详细信息
Frolov, D. S.
期 | 栏目 | 标题 | 文件 |
卷 50, 编号 3 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Investigation of Ion-Implanted Photosensitive Silicon Structures by Electrochemical Capacitance–Voltage Profiling | |
卷 53, 编号 2 (2019) | Fabrication, Treatment, and Testing of Materials and Structures | Technique for the Electrochemical Capacitance–Voltage Profiling of Heavily Doped Structures with a Sharp Doping Profile |