Informaçao sobre o Autor
Frolov, D. S.
| Edição | Seção | Título | Arquivo |
| Volume 50, Nº 3 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Investigation of Ion-Implanted Photosensitive Silicon Structures by Electrochemical Capacitance–Voltage Profiling | |
| Volume 53, Nº 2 (2019) | Fabrication, Treatment, and Testing of Materials and Structures | Technique for the Electrochemical Capacitance–Voltage Profiling of Heavily Doped Structures with a Sharp Doping Profile |