Electrical Properties of p-NiO/n-Si Heterostructures Based on Nanostructured Silicon


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详细

Silicon nanowires are formed on n-Si substrates by chemical etching. p-NiO/n-Si heterostructures are fabricated by reactive magnetron sputtering. The energy diagram of anisotype p-NiO/n-Si heterostructures is constructed according to the Anderson model. The current–voltage and capacitance–voltage characteristics are measured and analyzed. The main current-transport mechanisms through the p-NiO/n-Si heterojunction under forward and reverse biases are established.

作者简介

H. Parkhomenko

Yuriy Fedkovych Chernivtsi National University

编辑信件的主要联系方式.
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012

M. Solovan

Yuriy Fedkovych Chernivtsi National University

Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012

P. Maryanchuk

Yuriy Fedkovych Chernivtsi National University

Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012


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