X-Ray Study of the Superstructure in Heavily Doped Porous Indium Phosphide
- 作者: Boiko M.1, Sharkov M.1, Karlina L.1, Boiko A.1, Konnikov S.1
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隶属关系:
- Ioffe Institute
- 期: 卷 52, 编号 1 (2018)
- 页面: 84-87
- 栏目: Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors
- URL: https://journals.rcsi.science/1063-7826/article/view/202271
- DOI: https://doi.org/10.1134/S1063782618010074
- ID: 202271
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详细
An indium-phosphide InP sample subjected to the pore-generation procedure and then doped with S atoms is studied by the methods of X-ray diffraction analysis (XRD) and small-angle X-ray scattering (SAXS) (with CuKα1-radiation). The XRD data demonstrate that the sample consists of (coherent) aligned homogeneous components. A point detector is used to obtain, in the anomalous transmission mode by Borrmann, a set of SAXS curves at sample positions varied by azimuthal rotations. The SAXS data are used to simulate a 2D SAXS pattern for the sample under study, which makes it possible to determine the long-distance translation symmetry and, consequently, the presence of a superstructure. The interplanar distances in the superstructure in the directions (110) and (1 0) of the InP lattice are found to be ~260 and 450 nm, respectively. The symmetry group of the superstructure is determined as C2v in the (001) plane of the sample lattice.
作者简介
M. Boiko
Ioffe Institute
编辑信件的主要联系方式.
Email: boikomix@gmail.com
俄罗斯联邦, St. Petersburg, 194021
M. Sharkov
Ioffe Institute
Email: boikomix@gmail.com
俄罗斯联邦, St. Petersburg, 194021
L. Karlina
Ioffe Institute
Email: boikomix@gmail.com
俄罗斯联邦, St. Petersburg, 194021
A. Boiko
Ioffe Institute
Email: boikomix@gmail.com
俄罗斯联邦, St. Petersburg, 194021
S. Konnikov
Ioffe Institute
Email: boikomix@gmail.com
俄罗斯联邦, St. Petersburg, 194021