Информация об авторе
Vorotyntsev, V. M.
| Выпуск | Раздел | Название | Файл |
| Том 52, № 9 (2018) | Surfaces, Interfaces, and Thin Films | Poole–Frenkel Effect and the Opportunity of Its Application for the Prediction of Radiation Charge Accumulation in Thermal Silicon Dioxide |