Информация об авторе
Okulich, V. I.
Выпуск | Раздел | Название | Файл |
Том 52, № 9 (2018) | Spectroscopy, Interaction with Radiation | Calculation of the Influence of the Ion Current Density and Temperature on the Accumulation Kinetics of Point Defects under the Irradiation of Si with Light Ions |