Informaçao sobre o Autor
Presnyakov, R.
Edição | Seção | Título | Arquivo |
Volume 52, Nº 2 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Electrical Activity of Extended Defects in Multicrystalline Silicon | |
Volume 53, Nº 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters |