Informaçao sobre o Autor
Bokov, P. Yu.
Edição | Seção | Título | Arquivo |
Volume 51, Nº 2 (2017) | Spectroscopy, Interaction with Radiation | Raman scattering in InP doped by Be+-ion implantation | |
Volume 51, Nº 2 (2017) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Electroreflectance spectra from multiple InGaN/GaN quantum wells in the nonuniform electric field of a p–n junction | |
Volume 52, Nº 7 (2018) | Spectroscopy, Interaction with Radiation | Photoreflectance Spectroscopy Study of LT-GaAs Layers Grown on Si and GaAs Substrates | |
Volume 53, Nº 4 (2019) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Investigation into the Distribution of Built-in Electric Fields in LED Heterostructures with Multiple GaN/InGaN Quantum Wells by Electroreflectance Spectroscopy |