Автор туралы ақпарат
Popov, V. P.
Шығарылым | Бөлім | Атауы | Файл |
Том 50, № 5 (2016) | Physics of Semiconductor Devices | Biosensor properties of SOI nanowire transistors with a PEALD Al2O3 dielectric protective layer | |
Том 52, № 10 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Positive Charge in SOS Heterostructures with Interlayer Silicon Oxide | |
Том 52, № 13 (2018) | Surfaces, Interfaces, and Thin Films | Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO2 Surface Films | |
Том 53, № 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Bonding Energy of Silicon and Sapphire Wafers at Elevated Temperatures of Joining | |
Том 53, № 4 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Raman Scattering in InSb Spherical Nanocrystals Ion-Synthesized in Silicon-Oxide Films |