Автор туралы ақпарат
Nikonov, S. Yu.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 52, № 5 (2018) | XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization | Composition and Band Structure of the Native Oxide Nanolayer on the Ion Beam Treated Surface of the GaAs Wafer |