Автор туралы ақпарат
Seibt, M.
Шығарылым | Бөлім | Атауы | Файл |
Том 50, № 13 (2016) | Methods and Technique of Measurements | Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy |