Автор туралы ақпарат
Baranova, E. K.
Шығарылым | Бөлім | Атауы | Файл |
Том 50, № 8 (2016) | Fabrication, Treatment, and Testing of Materials and Structures | Estimation of the efficiency of the introduction of a porous layer into a silicon-on-sapphire structure substrate to enhance the reliability of devices under irradiation |