Автор туралы ақпарат
Vasil’ev, A. E.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 51, № 3 (2017) | Electronic Properties of Semiconductors | Effect of the energy of bombarding electrons on the conductivity of n-4H-SiC (CVD) epitaxial layers | |
| Том 52, № 3 (2018) | Electronic Properties of Semiconductors | Formation of Radiation Defects by Proton Braking in Lightly Doped n- and p-SiC Layers | |
| Том 53, № 5 (2019) | XVI International Conference “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018 | Thermoelectric Properties of Bi2 –xLuxTe2.7Se0.3 Solid Solutions | |
| Том 53, № 13 (2019) | Thermoelectrics and Their Applications | Effect of Spark Plasma Sintering Temperature on Thermoelectric Properties of Grained Bi1.9Gd0.1Te3 Compound |