Use of the Atomic Structure of Silicon Crystals to Obtain Multi-Tip Field-Emission Sources of Electrons
- Авторлар: Yafarov R.1
-
Мекемелер:
- Saratov Branch, Kotel’nikov Institute of Radio Engineering and Electronics
- Шығарылым: Том 52, № 2 (2018)
- Беттер: 137-142
- Бөлім: Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion)
- URL: https://journals.rcsi.science/1063-7826/article/view/202353
- DOI: https://doi.org/10.1134/S1063782618020239
- ID: 202353
Дәйексөз келтіру
Аннотация
The field-emission properties of field electron sources produced using the atomic structure of silicon crystals, the heterophase vacuum-plasma self-organization of island carbon coatings, and highly anisotropic plasma-chemical etching under weak-adsorption conditions are studied. A correlation between the morphological and field-emission characteristics of field cathode microstructures on silicon crystals with various conductivity types is ascertained. The results of experimental studies are interpreted using the Fowler–Nordheim theory in conjunction with changes in the compositions of the surface phases formed in fabricating emitting silicon projections.
Авторлар туралы
R. Yafarov
Saratov Branch, Kotel’nikov Institute of Radio Engineering and Electronics
Хат алмасуға жауапты Автор.
Email: pirpc@yandex.ru
Ресей, Saratov, 410019