Effect of X-Ray Radiation on the Optical Properties of Photorefractive Bismuth-Silicate Crystals
- Authors: Avanesyan V.T.1, Piskovatskova I.V.1, Stozharov V.M.1
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Affiliations:
- Herzen State Pedagogical University of Russia
- Issue: Vol 53, No 8 (2019)
- Pages: 1024-1027
- Section: Electronic Properties of Semiconductors
- URL: https://journals.rcsi.science/1063-7826/article/view/206589
- DOI: https://doi.org/10.1134/S1063782619080049
- ID: 206589
Cite item
Abstract
The results of investigations of the optical-absorption spectra of bismuth-silicate (Bi12SiO20) single crystals are presented. The band-gap width and the characteristic Urbach energy are determined. The effect of preliminary X-ray irradiation on the behavior of the experimental spectral dependences and the values of the characteristic parameters induced by the bismuth-silicate defect structure is established.
About the authors
V. T. Avanesyan
Herzen State Pedagogical University of Russia
Author for correspondence.
Email: avanesyan@mail.ru
Russian Federation, St. Petersburg, 191186
I. V. Piskovatskova
Herzen State Pedagogical University of Russia
Email: avanesyan@mail.ru
Russian Federation, St. Petersburg, 191186
V. M. Stozharov
Herzen State Pedagogical University of Russia
Email: avanesyan@mail.ru
Russian Federation, St. Petersburg, 191186