作者的详细信息
Makeev, M. O.
| 期 | 栏目 | 标题 | 文件 |
| 卷 50, 编号 1 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Assessment of the resistance to diffusion destruction of AlAs/GaAs nanoscale resonant-tunneling heterostructures by IR spectral ellipsometry |