Author Details
Jech, M.
Issue | Section | Title | File |
Vol 52, No 2 (2018) | Physics of Semiconductor Devices | Physical Principles of Self-Consistent Simulation of the Generation of Interface States and the Transport of Hot Charge Carriers in Field-Effect Transistors Based on Metal–Oxide–Semiconductor Structures | |
Vol 52, No 10 (2018) | Physics of Semiconductor Devices | Analysis of the Features of Hot-Carrier Degradation in FinFETs | |
Vol 52, No 13 (2018) | Physics of Semiconductor Devices | Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs |