Author Details
Solonitsyna, A.
Issue | Section | Title | File |
Vol 52, No 5 (2018) | XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization | Composition and Band Structure of the Native Oxide Nanolayer on the Ion Beam Treated Surface of the GaAs Wafer | |
Vol 52, No 16 (2018) | 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION | Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam | |
Vol 53, No 14 (2019) | Nanostructures Characterization | Arsenic Diffusion in the Natural Oxidation of the Heavily Defected GaAs Surface |