| Issue |
Title |
File |
| Vol 52, No 16 (2018) |
Influence of the Pore Structure on the Electron Barrier Height of Metal-Ceramic Nanomaterials Based on Gold-Anodic Aluminum Oxide |
(Eng)
|
|
Ushakov N.M., Vasil’kov M.Y., Shaturnuy V.R.
|
| Vol 52, No 16 (2018) |
Stable and Unstable Spatial Modes in a Resonator with a Half-Disk Shape |
(Eng)
|
|
Dunaevskiy M.S., Alekseev P.A., Monakhov A.M., Sokolovskii G.S., Baranov A.N., Arinero R., Teissier R.
|
| Vol 52, No 16 (2018) |
Reflectometry of X-ray Whispering Gallery Waves Propagating along Liquid Meniscuses |
(Eng)
|
|
Goray L.I., Asadchikov V.E., Roshchin B.S., Volkov Y.O., Tikhonov A.M.
|
| Vol 52, No 16 (2018) |
Polarization Properties of Photoluminescence of Anisotropic Polymer Films Containing Aligned Au Nanorods and Semiconductor Nanoparticles of Various Shape |
(Eng)
|
|
Gurinovich L.I., Trotsiuk L.L., Kulakovich O.S., Sushko N.I., Demir H.V., Gaponenko S.V.
|
| Vol 52, No 16 (2018) |
Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam |
(Eng)
|
|
Mikoushkin V.M., Bryzgalov V.V., Makarevskaya E.A., Solonitsyna A.P., Marchenko D.
|
| Vol 52, No 16 (2018) |
In situ Bandgap Determination of the GaAsN Nanolayer Prepared by Low-Energy \({\text{N}}_{2}^{ + }\)Ion Implantation |
(Eng)
|
|
Mikoushkin V.M.
|
| Vol 52, No 16 (2018) |
Atomic Force Microscopy Study of Monodisperse Carbon Nanoparticles |
(Eng)
|
|
Muravijova D.V., Ermakov I.A., Eurov D.A., Kirilenko D.A., Kurdyukov D.A., Rabchinskii M.K., Shvidchenko A.V., Trofimuk A.D., Baidakova M.V.
|
| Vol 52, No 16 (2018) |
Polarized Retroreflection from Nanoporous III–V Semiconductors |
(Eng)
|
|
Prislopski S.Y., Gaponenko S.V., Monaico E., Sergentu V.V., Tiginyanu I.M.
|
| Vol 52, No 16 (2018) |
XAFS Investigation of Nanoparticle Formation in 64Zn+ Ion Implanted and Thermo Oxidized Si |
(Eng)
|
|
Khramov E.V., Privezentsev V.V.
|
| Vol 52, No 16 (2018) |
Growth of Textured Au–Fe/Fe Hybrid Nanocrystals on Oxidized Silicon Surface |
(Eng)
|
|
Tarasov I.A., Smolyarova T.E., Yakovlev I.A., Kosyrev N.N., Komarov V.A., Nemtsev I.V., Varnakov S.N., Patrin S.G., Ovchinnikov S.G.
|
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