Effect of the Conductive Channel Cut-Off on Operation of n+nn+ GaN NW-Based Gunn Diode


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Abstract

Nowadays modern science and technology require development of efficient electromagnetic emitters covering far GHz and THz ranges. Semiconductor elements with negative differential resistance (NDR) such as Gunn diodes based on GaAs and InP are well-established powerful microwave emitters. In this work the Gunn diode structure based on single GaN nanowire with the potential of THz device development was proposed and investigated both theoretically and experimentally. According to the results of the numerical modeling, the Gunn generation can be obtained in the proposed geometry. Dependence of the doping concentration on the NW length necessary for the electrons domain formation was obtained. The nanostructures were grown via molecular beam epitaxy technique. Contacts to single nanowires were fabricated with the combination of e-beam lithography and thermal evaporation. It was shown experimentally that the volt-ampere characteristics of the GaN nanowire structure possess current saturation region. Experimental results correspond well to proposed numerical model.

About the authors

A. M. Mozharov

St. Petersburg Academic University, Russian Academy of Sciences

Author for correspondence.
Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021

A. A. Vasiliev

St. Petersburg Academic University, Russian Academy of Sciences

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021

F. E. Komissarenko

ITMO University

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 197101

A. D. Bolshakov

St. Petersburg Academic University, Russian Academy of Sciences

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021

G. A. Sapunov

St. Petersburg Academic University, Russian Academy of Sciences

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021

V. V. Fedorov

St. Petersburg Academic University, Russian Academy of Sciences

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021

G. E. Cirlin

St. Petersburg Academic University, Russian Academy of Sciences; ITMO University; Institute for Analytical Instrumentation, Russian Academy of Sciences

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197101; St. Petersburg, 190103

I. S. Mukhin

St. Petersburg Academic University, Russian Academy of Sciences; ITMO University

Email: mozharov@spbau.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197101


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