Air-Oxidation of Nb Nano-Films

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Abstract

X-ray photoelectron spectroscopy (XPS) depth chemical and phase profiling of air-oxidized niobium nanofilms has been performed. It is found that oxide layer thicknesses depend on the initial thickness of the niobium nanofilm. The increase in thickness of the initial Nb nano-layer is due to increase in thickness of an oxidized layer.

About the authors

A. V. Lubenchenko

National Research University MPEI

Author for correspondence.
Email: LubenchenkoAV@mpei.ru
Russian Federation, Moscow, 111250

A. A. Batrakov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Russian Federation, Moscow, 111250

D. A. Ivanov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Russian Federation, Moscow, 111250

O. I. Lubenchenko

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Russian Federation, Moscow, 111250

I. A. Lashkov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Russian Federation, Moscow, 111250

A. B. Pavolotsky

Chalmers University of Technology

Email: LubenchenkoAV@mpei.ru
Sweden, Goteborg, 41296

B. Schleicher

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Germany, Dresden, 01069

N. Albert

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Germany, Dresden, 01069

K. Nielsch

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Germany, Dresden, 01069


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