Dependence of Microcontroller Failure Parameters via Ultrashort Radio Pulses under Operation Conditions
- Авторы: Stepovik A.1, Armanov M.1, Shamaev E.1, Kondrat’ev A.1, Sorokin I.1, Zavolokov E.1
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Учреждения:
- Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
- Выпуск: Том 64, № 5 (2019)
- Страницы: 524-532
- Раздел: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/200792
- DOI: https://doi.org/10.1134/S1064226919050127
- ID: 200792
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Аннотация
In this paper, we studied the functional failure of microcontroller (MC) ATmega8515 under ultrashort pulse series action at clocking frequencies of 1, 8, and 15 MHz. We analyzed the probabilities of occurrence in various types of failure and their connection with clocking frequency and magnitude of field strength. The correlation of MC failure with its operation phase is shown. The possibility to study, at least qualitatively, the behavior of complex electronic systems using well-known mathematical models was demonstrated.
Об авторах
A. Stepovik
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Автор, ответственный за переписку.
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770
M. Armanov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770
E. Shamaev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770
A. Kondrat’ev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770
I. Sorokin
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770
E. Zavolokov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Россия, Snezhinsk, 456770