Dependence of Microcontroller Failure Parameters via Ultrashort Radio Pulses under Operation Conditions
- 作者: Stepovik A.1, Armanov M.1, Shamaev E.1, Kondrat’ev A.1, Sorokin I.1, Zavolokov E.1
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隶属关系:
- Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
- 期: 卷 64, 编号 5 (2019)
- 页面: 524-532
- 栏目: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/200792
- DOI: https://doi.org/10.1134/S1064226919050127
- ID: 200792
如何引用文章
详细
In this paper, we studied the functional failure of microcontroller (MC) ATmega8515 under ultrashort pulse series action at clocking frequencies of 1, 8, and 15 MHz. We analyzed the probabilities of occurrence in various types of failure and their connection with clocking frequency and magnitude of field strength. The correlation of MC failure with its operation phase is shown. The possibility to study, at least qualitatively, the behavior of complex electronic systems using well-known mathematical models was demonstrated.
作者简介
A. Stepovik
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
编辑信件的主要联系方式.
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770
M. Armanov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770
E. Shamaev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770
A. Kondrat’ev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770
I. Sorokin
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770
E. Zavolokov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770