Dependence of Microcontroller Failure Parameters via Ultrashort Radio Pulses under Operation Conditions


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In this paper, we studied the functional failure of microcontroller (MC) ATmega8515 under ultrashort pulse series action at clocking frequencies of 1, 8, and 15 MHz. We analyzed the probabilities of occurrence in various types of failure and their connection with clocking frequency and magnitude of field strength. The correlation of MC failure with its operation phase is shown. The possibility to study, at least qualitatively, the behavior of complex electronic systems using well-known mathematical models was demonstrated.

作者简介

A. Stepovik

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

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Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770

M. Armanov

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770

E. Shamaev

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770

A. Kondrat’ev

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770

I. Sorokin

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770

E. Zavolokov

Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics

Email: dep5@vniitf.ru
俄罗斯联邦, Snezhinsk, 456770


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