Dependence of Microcontroller Failure Parameters via Ultrashort Radio Pulses under Operation Conditions
- Autores: Stepovik A.1, Armanov M.1, Shamaev E.1, Kondrat’ev A.1, Sorokin I.1, Zavolokov E.1
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Afiliações:
- Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
- Edição: Volume 64, Nº 5 (2019)
- Páginas: 524-532
- Seção: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/200792
- DOI: https://doi.org/10.1134/S1064226919050127
- ID: 200792
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Resumo
In this paper, we studied the functional failure of microcontroller (MC) ATmega8515 under ultrashort pulse series action at clocking frequencies of 1, 8, and 15 MHz. We analyzed the probabilities of occurrence in various types of failure and their connection with clocking frequency and magnitude of field strength. The correlation of MC failure with its operation phase is shown. The possibility to study, at least qualitatively, the behavior of complex electronic systems using well-known mathematical models was demonstrated.
Sobre autores
A. Stepovik
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Autor responsável pela correspondência
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770
M. Armanov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770
E. Shamaev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770
A. Kondrat’ev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770
I. Sorokin
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770
E. Zavolokov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Rússia, Snezhinsk, 456770