Dependence of Microcontroller Failure Parameters via Ultrashort Radio Pulses under Operation Conditions
- Авторлар: Stepovik A.1, Armanov M.1, Shamaev E.1, Kondrat’ev A.1, Sorokin I.1, Zavolokov E.1
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Мекемелер:
- Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
- Шығарылым: Том 64, № 5 (2019)
- Беттер: 524-532
- Бөлім: Physical Processes in Electron Devices
- URL: https://journals.rcsi.science/1064-2269/article/view/200792
- DOI: https://doi.org/10.1134/S1064226919050127
- ID: 200792
Дәйексөз келтіру
Аннотация
In this paper, we studied the functional failure of microcontroller (MC) ATmega8515 under ultrashort pulse series action at clocking frequencies of 1, 8, and 15 MHz. We analyzed the probabilities of occurrence in various types of failure and their connection with clocking frequency and magnitude of field strength. The correlation of MC failure with its operation phase is shown. The possibility to study, at least qualitatively, the behavior of complex electronic systems using well-known mathematical models was demonstrated.
Авторлар туралы
A. Stepovik
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Хат алмасуға жауапты Автор.
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770
M. Armanov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770
E. Shamaev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770
A. Kondrat’ev
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770
I. Sorokin
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770
E. Zavolokov
Russian Federal Nuclear Center, All-Russia Research Institute of Technical Physics
Email: dep5@vniitf.ru
Ресей, Snezhinsk, 456770